{"id":141478,"date":"2026-01-12T18:02:43","date_gmt":"2026-01-12T18:02:43","guid":{"rendered":"https:\/\/www.deberes.net\/tesis\/sin-categoria\/influencia-de-la-microestructura-y-geometria-de-la-linea-en-la-electromigracion-bajo-corrientes-bidireccionales-bc-y-pulsadas-pdc\/"},"modified":"2026-01-12T18:02:43","modified_gmt":"2026-01-12T18:02:43","slug":"influencia-de-la-microestructura-y-geometria-de-la-linea-en-la-electromigracion-bajo-corrientes-bidireccionales-bc-y-pulsadas-pdc","status":"publish","type":"post","link":"https:\/\/www.deberes.net\/tesis\/fisica\/influencia-de-la-microestructura-y-geometria-de-la-linea-en-la-electromigracion-bajo-corrientes-bidireccionales-bc-y-pulsadas-pdc\/","title":{"rendered":"Influencia de la microestructura y geometria de la linea en la electromigracion bajo corrientes bidireccionales (bc) y pulsadas (pdc)"},"content":{"rendered":"<h2>Tesis doctoral de <strong> Enrique Casta\u00f1o Carmona <\/strong><\/h2>\n<p>Uno de los principales problemas de fiabilidad que presentan las interconexiones de circuitos integrados vlsi es la electromigracion. En la presente tesis se ha desarrollado un modelo fisico de la electromigracion que ha permitido justificar teoricamente numerosos resultados experimentales. Asi mismo, y junto al analisis microscopico de interconexiones ensayadas electricamente, ha posibilitado la deteccion de las configuraciones geometrico-microestructurales mas peligrosas desde el punto de vista de generacion de da\u00f1o por electromigracion. La realizacion de experimentos \u00abin situ\u00bb, ensayo electrico bajo observacion microscopica directa, ha demostrado el papel que juega en el fallo de la interconexion el comportamiento dinamico de las grietas de electromigracion. Hasta ahora habia sido costumbre el asumir un crecimiento estatico de la grieta hasta el fallo del dispositivo.<\/p>\n<p>&nbsp;<\/p>\n<h3>Datos acad\u00e9micos de la tesis doctoral \u00ab<strong>Influencia de la microestructura y geometria de la linea en la electromigracion bajo corrientes bidireccionales (bc) y pulsadas (pdc)<\/strong>\u00ab<\/h3>\n<ul>\n<li><strong>T\u00edtulo de la tesis:<\/strong>\u00a0 Influencia de la microestructura y geometria de la linea en la electromigracion bajo corrientes bidireccionales (bc) y pulsadas (pdc) <\/li>\n<li><strong>Autor:<\/strong>\u00a0 Enrique Casta\u00f1o Carmona <\/li>\n<li><strong>Universidad:<\/strong>\u00a0 Navarra<\/li>\n<li><strong>Fecha de lectura de la tesis:<\/strong>\u00a0 01\/01\/1992<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<h3>Direcci\u00f3n y tribunal<\/h3>\n<ul>\n<li><strong>Director de la tesis<\/strong>\n<ul>\n<li> Urcola Galarza Jos\u00e9 Javier<\/li>\n<\/ul>\n<\/li>\n<li><strong>Tribunal<\/strong>\n<ul>\n<li>Presidente del tribunal: Manuel Fuentes Perez <\/li>\n<li> Martinez Duart Jos\u00e9 Manuel (vocal)<\/li>\n<li>Jos\u00e9 Serna Alcaraz (vocal)<\/li>\n<li>  (vocal)<\/li>\n<\/ul>\n<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Tesis doctoral de Enrique Casta\u00f1o Carmona Uno de los principales problemas de fiabilidad que presentan las interconexiones de circuitos integrados [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"site-sidebar-layout":"default","site-content-layout":"","ast-site-content-layout":"","site-content-style":"default","site-sidebar-style":"default","ast-global-header-display":"","ast-banner-title-visibility":"","ast-main-header-display":"","ast-hfb-above-header-display":"","ast-hfb-below-header-display":"","ast-hfb-mobile-header-display":"","site-post-title":"","ast-breadcrumbs-content":"","ast-featured-img":"","footer-sml-layout":"","theme-transparent-header-meta":"","adv-header-id-meta":"","stick-header-meta":"","header-above-stick-meta":"","header-main-stick-meta":"","header-below-stick-meta":"","astra-migrate-meta-layouts":"default","ast-page-background-enabled":"default","ast-page-background-meta":{"desktop":{"background-color":"var(--ast-global-color-4)","background-image":"","background-repeat":"repeat","background-position":"center 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